I am a Ph.D. candidate under the supervision of Professor Javier Esparza in the Chair for Foundations of Software Reliability and Theoretical Computer Science at the Technical University of Munich (TUM) since October 2018. I am interested in Verification, Automata and Petri Net theory, and more generally in mathematical reasoning in a computer science setting. I am currently working on Petri net verification and population protocols in the context of the ERC-supported project PaVeS. You can find more about my research on dblp, Google Scholar.
I obtained my Master’s degree in Computer Science from the École Normale Supérieure Paris-Saclay (formerly ENS Cachan). I earned a Bachelor’s degree in Fundamental and Applied Mathematics from the Université Paris-Sud (formerly Université d’Orsay). More information on my academic background can be found in my curriculum vitae.
M. Raskin, C. Weil-Kennedy. Efficient Restrictions of Immediate Observation Petri Nets. Reachability Problems 2020. (arXiv)
M. Raskin, C. Weil-Kennedy, J. Esparza. Flatness and Complexity of Immediate Observation Petri Nets. CONCUR 2020. (arXiv)
J. Esparza, M. Raskin, C. Weil-Kennedy. Parameterized Analysis of Immediate Observation Petri Nets. Petri Nets 2019. (arXiv) Received the Best Paper Award.
J. Esparza, P. Ganty, R. Majumdar, C. Weil-Kennedy. Verification of Immediate Observation Population Protocols. CONCUR 2018. (arXiv)
Flatness of Branching Immediate Observation Petri Nets. September 18th 2020, Highlights conference, Online.
Branching Immediate Observation Petri nets: a strong class with simple reachability. July 7th 2020, Infinity workshop (satellite of LICS/ICALP), Online.
The Complexity of Verifying Observation Population Protocols. September 18th 2019, Highlights, Warsaw, Poland.
Parameterized Analysis of Immediate Observation Petri Nets. June 28th 2019, Petri Nets, Aachen, Germany.
Verification of Immediate Observation Population Protocols. September 7th 2018, CONCUR, Beijing, China.
I am or have been a tutor for the following lectures at TUM.